New PDF release: Advances in Imaging and Electron Physics, Vol. 126

By Peter W. Hawkes

ISBN-10: 0120147688

ISBN-13: 9780120147687

The 4 surveys contained during this quantity illustrate largely different points of imaging and electron physics. the 1st chapters handle functions of electron microscopy, together with the function of this system in mineralogy and a learn of the excessive- answer electron microscopy of quasicrystals. The latter is basically a brief monograph proposing the underlying crystallography and explaining intimately how the corresponding photographs and diffraction styles might be interpreted. The 3rd contribution is an account of a brand new method of deconvolution in photo processing within which the writer, through associating a polynomial with the gray-level values of (discrete) pictures, exhibits that it's attainable to invert the convolutional relation that describes many varieties of picture formation. the quantity ends with a close dialogue of the twin de Broglie wave, together with a serious account of recent advancements within the debate over the lifestyles and function of this type of wave.

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9a). When compared with Figure 21a, the difference is 38 ´ ODO ET AL. ARNE impressive: for Áx > supða1 ; a2 Þ, the magnitudes of BH ¼ 1=3 (x) are found uncorrelated. D. Using the 2D WTMM Method to Perform Image Processing Tasks We now want to discuss the ability to use the WTMM method for specific purposes in image processing. We refer the reader to previous work [108] for edge detection and image denoising applications, and also to the work of Levy-Vehel [168,169] for previous attempts to use multifractal concepts for image analysis.

According to Eq. (21), one uses the wavelet transform skeleton to compute the partition function Zðq; aÞ on the discrete set of considered scales amin a amax . Then, for a given value of q 2 ½qmin ; qmax Š, one extracts the exponent ðqÞ [Eq. (22)] from a linear regression fit of lnZðq; aÞ vs. lna. As a test of the robustness of our measurement, we examine the stability of our estimate of ðqÞ with respect to the range of scales ½aÃmin ; aÃmax Š & ½amin ; amax Š over which the linear regression fit is performed.

ARNE 20  q ¼ 0: From Eqs. (21) and (22), one deduces that the exponent ð0Þ accounts for the divergence of the number of maxima lines in the limit a ! 0þ . This number basically corresponds to the number of wavelets of size a required to cover the set S of singularities of f. In full analogy with standard box-counting arguments [19–27], Àð0Þ can be identified to the fractal dimension (capacity) of this set: Àð0Þ ¼ dF fx; hðxÞ < þ1g ð24Þ  q ¼ 1: As pointed out [48], the value of the exponent ð1Þ is related to the fractal dimension (capacity) of the rough surface S defined by the function f.

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Advances in Imaging and Electron Physics, Vol. 126 by Peter W. Hawkes


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